Process for Assessment and Mitigation of Early Wearout of Life-Limited Microcircuits ARP6338A

DOI: https://doi.org/10.4271/ARP6338A

Issuing Committee: APMC Avionics Process Management

Publisher: SAE International

Pages: 14

Rationale: As microcircuit technology progresses, the risk of early wearout increases for users in the aerospace, automotive, defense, and other high performance (AADHP) industries. There is a need for these industries to have a standardized approach to analysis and testing for wearout, to ensure reliability and durability of future products, and to assess likelihood of early wearout in safety and certification analyses. The standardized approach also is intended to avoid introducing competitive disadvantages to those who address the issue pro-actively and effectively. This revision is being made to (1) revise, correct, and update the wearout acceleration models in Appendix D, (2) remove references to specific wearout analysis software tools in Appendix F (rev original), and revise Appendix F (rev original) to list essential attributes of such tools (and to rename it Appendix E in rev A), (3) to rename Appendix E, mitigation methods in rev original, to Appendix F, mitigation methods, in rev A, and (4) revise and update the language in other clauses to be consistent with subsequent SAE standards work, e.g., ARP6379 and SAE J3168.